Shenzhen Shijia Instruments Co., Ltd.

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Specializing in spectrum analyzers, network analyzers, signal generators, LCR meters, oscilloscopes, power supplies, probes, digital multimeters, data acquisition systems, source measure units, power meters, battery testers, resistance testers and other high-frequency test instruments

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TH2840A/TH2840B LCR Digital Bridge

  • ModelTH2840A、TH2840B
  • AttributesLCR Digital Bridge
  • Category TONGHUI > LCR Digital Bridge
  • BrandTONGHUI
  • DescriptionThe Tonghui TH2840A/TH2840B LCR digital bridges feature a high test speed of 0.56ms and a wide frequency range, support multiple test modes and 10-bin sorting, suitable for component impedance evaluation and material characteristic analysis.
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Detailed Introduction Technical Documents

Standard Configuration

  • ☑RS232    ☑USB HOST    ☑USB DEVICE

  • ☑HANDLER    ☑LAN    ☑External DCI


Introduction

TH2840A/TH2840B LCR Digital Bridge features a test speed of 0.56ms (1800 measurements per second). TH2840A features a test frequency range of 20Hz-500kHz, while TH2840B features a test frequency range of 20Hz-2MHz. Equipped with a 10.1-inch capacitive touch screen of 1280×800 resolution, it supports three test modes: spot measurement, list sweep and graphic sweep, as well as four-parameter measurement. It features 10-level sorting function, and is compatible with SCPI/MODBUS command set, compatible with models such as KEYSIGHT E4980A. It can be used for impedance parameter evaluation and performance analysis of passive components, semiconductor components, dielectric materials and other test items.


Features

  • High stability and consistency: 14 range configurations

  • High power: Signal level 20VAC/100mAAC, built-in DC bias ±40VDC/100mADC, built-in 2A current source, DCR level 20V

  • High speed: Test speed up to 0.56ms (1800 tests per second)

  • High-resolution display: 10.1-inch capacitive touch screen, 1280×800 resolution, 16:9 aspect ratio

  • Multiple test modes: Point test, list sweep and graphic sweep

  • Four-parameter measurement function, supports 201-point multi-parameter list sweep

  • Graphic sweep function: 4 traces optional, supports 1/2/4 split screen

  • Sorting function: 10-bin sorting in LCR mode

  • High compatibility: Supports SCPI/MODBUS command set, compatible with KEYSIGHT E4980A, E4980AL, HP4284A

Applications

  • Passive Components:
    Impedance parameter evaluation and performance analysis for capacitors, inductors, magnetic cores, resistors, piezoelectric devices, transformers, chip components and network components, etc.

  • Semiconductor Components:
    Parasitic parameter test and analysis for LED drive integrated circuits; C-V characteristics of varactor diodes; parasitic parameter analysis of transistors and integrated circuits

  • Other Components:
    Impedance evaluation of printed circuit boards, relays, switches, cables, batteries and other components

  • Dielectric Materials:
    Evaluation of permittivity and loss angle of plastics, ceramics and other materials

  • Magnetic Materials:
    Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials

  • Semiconductor Materials:
    Permittivity, conductivity and C-V characteristics of semiconductor materials


Product ModelTH2840ATH2840B
  DisplayDisplay10.1-inch Capacitive Touch Screen
Aspect Ratio16:9
Resolution1280×RGB×800
Measurement ParametersModeAny four parameters selectable
ACCp/Cs、Lp/Ls、Rp/Rs、|Z|、|Y|、R、X、G、B、θ、D、Q、VAC、IAC
DCRDC、VDC、IDC
Test FrequencyRange20Hz-500kHz20Hz-2MHz
Accuracy0.01%
Resolution0.1mHz (20.0000Hz-99.9999Hz)
1mHz (100.000Hz-999.999Hz)
10mHz (1.00000kHz-9.99999kHz)
100mHz (10.0000kHz-99.9999kHz )
1Hz (100.000kHz-999.999kHz)
10Hz (1.00000MHz-2.00000MHz)
AC Test Signal ModeRated Value (ALC OFF)Set voltage refers to Hcur voltage when the test terminal is open-circuited
Set current refers to output current from Hcur when the test terminal is short-circuited
Constant Value (ALC ON)Keep the voltage on DUT consistent with the set value
Keep the current on DUT consistent with the set value
Test LevelVoltage Range5mVrms-20VrmsF≤1MHz 5mVrms-20Vrms F＞1MHz 5mVrms-15Vrms
Accuracy±（10%×setting + 2mV）（AC≤2Vrms） ±（10%×setting + 5mV）（AC＞2Vrms）
Resolution1mVrms（5mVrms-0.2Vrms）
1mVrms（0.2Vrms-0.5Vrms）
1mVrms(0.5Vrms-1Vrms)
10mVrms(1Vrms-2Vrms)
10mVrms(2Vrms-5Vrms)
10mVrms(5Vrms-10Vrms)
10mVrms(10Vrms-20Vrms)
Current Range50μArms-100mArms
Resolution (100Ω internal resistance)10μArms (50μArms-2mArms)
10μArms (2mArms-5mArms)
10μArms (5mArms-10mArms)
100μArms (10mArms-20mArms)
100μArms (20mArms-50mArms)
100μArms (50mArms-100mArms)
RDC TestVoltage Range100mV-20V
Resolution1mV(0V-1V)
10mV(1V-20V)
Current Range0mA-100mA
Resolution10μA(0mA-10mA)
100μA(10mA-100mA)
DC BiasVoltage Range0V-±40V
AccuracyAC≤2V 1% × set voltage + 5mV
AC>2V 2% × set voltage + 8mV
Resolution1mV(0V-1V)
10mV(±1V- ±40V)
Current Range0mA-±100mA
Resolution10μA(0mA-10mA)
100μA(10mA-100mA)
Built-in Current SourceCurrent Range0mA-2A
AccuracyI>5mA ±(2% × setting value + 2mA)
Resolution1mA
Test Terminal ConfigurationFour-terminal Pair
Test Cable Length0m, 1m, 2m, 4m
Output Impedance30Ω，±4%@1kHz
100Ω，±2%@1kHz
Mathematical OperationAbsolute deviation Δ from nominal value, percentage deviation Δ% from nominal value
Equivalence ModeSeries, Parallel
Calibration FunctionOpen circuit OPEN, Short circuit SHORT, Load LOAD
Measurement Averaging1 to 255 times
Range SelectionAutomatic AUTO, Manual HOLD
Range ConfigurationLCR100mΩ、1Ω、10Ω、20Ω、50Ω、100Ω、200Ω、500Ω、1kΩ、2kΩ、5kΩ、10kΩ、20kΩ、50kΩ、100kΩ
RDC1Ω、10Ω、20Ω、50Ω、100Ω、200Ω、500Ω、1kΩ、2kΩ、5kΩ、10kΩ、20kΩ、50kΩ、100kΩ
Measurement Time (ms)Fast+:0.56ms Fast:3.3ms
Medium: 90ms
Slow: 220ms
Maximum Accuracy0.05% (Refer to the manual for details)
Measurement Display Range
Cs、Cp0.00001pF-9.99999F
Ls、Lp0.00001μH-99.9999kH
D0.00001-9.99999
Q0.00001-99999.9
R、Rs、Rp、X、Z、RDC0.001mΩ-99.9999MΩ
G, B, Y0.00001μs-99.999S
VDC±0V-±999.999V
IDC±0A-±999.999A
θr-3.14159-3.14159
θd-179.999°-179.999°
Δ%±（0.000%-999.9%）
Multi-function Parameter List ScanNumber of Points201 points, averaging times can be set for each point, each point can be sorted individually
ParametersTest Frequency, AC Voltage, AC Current, DC BIAS Voltage, DC BIAS Current (100mA), DC BIAS Current (2A)
Trigger ModeSequence SEQ: After one trigger, measurement is performed on all scan points, /EOM/INDEX is output only once
Step STEP: Each trigger executes one scan point measurement, /EOM/INDEX is output for every point, but the comparator result of list scan is only output at the last /EOM
Other Features1. Multiple copy functions are available for both scan parameters and test parameters 2. Delay can be set for each scan point
ComparatorUp to four test parameters can be measured per scan point, upper and lower limits can be set for each parameter. PASS signal is output when all test parameters are qualified, otherwise FAIL signal is output. No judgment will be made if upper and lower limits are not configured
Graphical ScanningNumber of Scan Points51, 101, 201, 401, 801 points optional
Result DisplayExtreme values of each parameter, and scan parameter values and corresponding test parameter values at the cursor position
Scan Trace1 to 4 test parameters are available for arbitrary selection, scan curves can be displayed in 1-split, 2-split or 4-split screen
Display RangeReal-time Auto, Locked
Axis ScaleLogarithmic, Linear
Sweep ParametersFrequency, AC Voltage, AC Current, DCV BIAS / DCI  BIAS(100mA) / DCI  BIAS(2A)
Trigger ModeSingleManually trigger once, complete one sweep from start to end, the next trigger signal starts a new sweep
ContinuousInfinite cyclic sweep from start to end
Result StorageGraphics & Files
ComparatorBin Sorting10Bin、PASS、FAIL
Bin Deviation SettingDeviation Value, Percentage Deviation, Off
Bin ModeTolerance, Continuous
Bin Counting0-99999
Bin DiscriminationUp to four parameter limit ranges can be set per bin. If the results of four test parameters are within the set bin range, the corresponding bin number will be displayed; if the result exceeds the maximum set bin range, FAIL will be displayed; test parameters without upper and lower limits set will automatically skip bin discrimination
PASS/FAIL IndicationIf the result falls into Bin1-10, the PASS LED on the front panel will light up; otherwise the FAIL LED will light up
Data Buffer201 measurement results can be read in batches
Storage and RecallInternalApprox. 100MB non-volatile memory for test setting files
External USBTest setting files, screenshots and record files
Keyboard LockFront panel keys can be locked, other functions are to be expanded
InterfacesUSB HOST2 USB HOST interfaces, can connect mouse and keyboard simultaneously, only one USB flash drive can be used at the same time
USB DEVICEUniversal Serial Bus receptacle, Mini Type B (4 contact positions); compliant with USB TMC-USB488 and USB 2.0, female connector for connecting external controllers
LAN10/100M Ethernet auto-negotiation
HANDLERUsed for Bin sorting signal output
External DC BIAS ControlSupports TH1778A
RS232CStandard 9-pin crossover
RS485Custom modification available, or external RS232 to RS485 module supported
Power-on Warm-up Time60 minutes
Input VoltageSelectable 100-120VAC/198-242VAC, 47-63Hz
Power ConsumptionNot less than 130VA
Dimensions (WxHxD) mm3430x177x265
Weight (kg)11kg

 

Accessories

 

Standard Configuration
Accessory NameModel
Four-terminal Insulated Locked Kelvin Test Lead with BoxTH26011BS
FixtureTH26048
Shorting PlateTH26010